a - 2005 17 - may. LUE2643-1-PF ligitek electronics co.,ltd. property of ligitek only LUE2643-1-PF super bright round type led lamps data sheet doc. no : qw0905- rev. : date : pb lead-free parts
1/5 page LUE2643-1-PF part no. ligitek electronics co.,ltd. property of ligitek only package dimensions note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation 25.0min 1.0min 2.54typ 4.3 3.3 0.5 typ 1.5max 3.1 2.9
2/5 20 2.6 1.7 orange algainp LUE2643-1-PF water clear note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. absolute maximum ratings at ta=25 j i fp pd i f tstg t opr tsol esd symbol typical electrical & optical characteristics (ta=25 j ) power dissipation reverse current @5v electrostatic discharge storage temperature soldering temperature operating temperature parameter peak forward current duty 1/10@10khz forward current part no. LUE2643-1-PF 120 -40 ~ +100 max 260 j for 5 sec max (2mm from body) -40 ~ +85 ir 2000 10 ratings ue 90 50 mw j v j g a ma ma unit ligitek electronics co.,ltd. property of ligitek only page 40 viewing angle 2 c 1/2 (deg) min. 450 min. forward voltage @ ma(v) max. dominant wave length f dnm 620 spectral halfwidth ??f nm 17 typ. luminous intensity @20ma(mcd) 900 emitted part no material lens color
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity @20ma wavelength (nm) forward voltage@20ma normaliz @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity @20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0 0.5 550 2.0 3.0 4.0 5.0 0.8 40 -20 -40 80 100 60 0 0.5 1.0 1.5 2.0 0.9 1.2 1.0 1.1 1.0 1.5 2.0 2.5 600 650 700 0 0.5 1.0 2.5 3.0 20 0 20 -40 0 -20 80 40 60 100 3.0 ue chip part no. LUE2643-1-PF 3/5 page
120 seconds max soldering soldering iron:30w max temperature 300 c max soldering time:3 seconds max distance:2mm min(from solder joint to case) dip soldering preheat: 120 c max preheat time: 120 seconds max ramp-up 3c/sec(max) ramp-down:-5 c/sec(max) solder bath:245 c max dipping time:5 seconds max distance:2mm min(from solder joint to case) 120 seconds max soldering soldering iron:30w max temperature:350 cmax soldering time:3seconds max distance:2mm min(from solder joint to case) dip soldering preheat: 140 c max preheat time: 120seconds max ramp-up 3c/sec(max) ramp-down:-5 c/sec(max) solder bath:265 c max dipping time:5 seconds max distance:2mm min(from solder joint to case) preheat time(sec) 265c 5sec max 25x 140x 3 /sec max 265x temp(xc) 5 /sec max wave soldering profile (pb free) ligitek electronics co.,ltd. property of ligitek only page 4/5 part no. LUE2643-1-PF temp(xc) 245c 5sec max 25x preheat 3 /sec max 120x 245x time(sec) 5 /sec max wave soldering profile
page 5/5 part no. LUE2643-1-PF this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hous. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec high temperature high humidity test thermal shock test solder resistance test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only
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